Predicting the Risk Level and Position of Objects in the Forklift's Blind Spot Area Using Artificial Neural Network

Prasetyo, Tegar and Bahiuddin, Irfan and Rezy Pratama, Dafa and Winarno, Agustinus and Hatta Mohammed Ariff, Mohd and Danny Kurniawan, Sthepanus and Surojo, Surojo (2023) Predicting the Risk Level and Position of Objects in the Forklift's Blind Spot Area Using Artificial Neural Network. In: 2023 1st International Conference on Advanced Engineering and Technologies (ICONNIC), 14 October 2023, Kediri, Indonesia.

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Abstract

This paper presents a new application of artificial neural networks (ANN) for identifying blind spot condition severities and positions of a forklift. A microcontroller-based device is also developed for measuring the distance at the rear blind spot areas. The built ANN can also be deployed in the device. The training data is obtained from the measurement in a 5-ton capacity forklift, and the identification is determined based on the literature and visual checking from the operator's point of view. The input data include the distance and angle obtained from readings of ultrasonic sensors configured like a 180° radius radar. The predicted risk level predictions are categorized into safe, cautious, and dangerous. The detected object's position predictions are categorized into left, rear, and right. The neural network model employed is built based on a backpropagation algorithm. After varying the hidden node number, the best results were achieved at 70. For training and testing cases, both outputs' performance is in good agreement with expert determination identified by the precision, recall, and F1 score metrics, with these parameters yielding a value of 1. The results indicate that the developed system has promising potential for predicting blindspot severities. © 2023 IEEE.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Cited by: 0
Uncontrolled Keywords: Neural networks; Object detection; Personnel training; Ultrasonic applications; Blind spots; Condition; Input datas; Microcontroller-based; New applications; Object positions; Objects detection; Risk levels; Training data; Visual checking; Forecasting
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Vocational School
Depositing User: Sri JUNANDI
Date Deposited: 04 Nov 2024 07:38
Last Modified: 04 Nov 2024 07:38
URI: https://ir.lib.ugm.ac.id/id/eprint/10504

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