Magnetic properties and microstructural of ion-implanted Gadolia doped Ceria-Barium monoferrite thin film deposited on Kapton for electromagnetic wave absorber application

Gadolia-doped Ceria-Barium Monoferrite (GDC-BaFe2O4) thin films have been deposited on Kapton sheets using the DC sputtering method as electromagnetic (EM) wave-absorbing materials. The present study has examined the structural, magnetic, and microwave absorption properties of GDC-BaFe2O4. The primary approaches used in this investigation included changing the surface form and applying EM wave-absorbing materials as surface coatings. X-ray diffraction research showed that the GDC-BaFe2O4 thin films have an orthorhombic crystal structure. The bonding investigation revealed the existence of Fe-O, Ce-O, and Ba-O-Ba functional groups at 426.87, 517.42 and 1014.84 cm−1, respectively. Vibrating-sample magnetometry confirmed that saturation magnetization decreased with increasing sputtering time and revealed the ferromagnetic behavior of the GDC-BaFe2O4 thin film. Ce, Gd, Ba, Fe, and O were evenly and similarly distributed over the Kapton surface of the GDC-BaFe2O4 thin films, according to energy-dispersive X-ray spectroscopy and scanning electron microscopy. Based on the atomic force microscopy test, the root-mean-square roughness (Rq) increased during the ion implantation procedure. With a 7.5-minute sputtering period, the microwave absorption ability reached a maximum reflection loss value of −39.6 dB (99.98 %) at 10 GHz. As a result of these findings, GDC-BaFe2O4 appears to be a promising candidate for EM wave absorption.