Tofu shelf life using electronic nose based on curve fitting method

Lelono, Danang and Putri, Rizky P. and Atmaji, Catur (2019) Tofu shelf life using electronic nose based on curve fitting method. In: 5th International Conference on Science and Technology (ICST), Yogyakarta, Indonesia.

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Abstract

During this time, determining the shelf life of tofu still uses human smell and vision. Although this method is realistic, but it is subjective and cannot be used as standardization of measurement. Electronic nose as the alternative instrument, can be used to predict the shelf life of tofu based on the qualitative aroma pattern produced. The information stored in the response sensor is the result of the conversion of metal oxide semiconductor (MOS) gas sensor array. Then the information is extracted using the maximum method and predicted shelf life of Tofu with curve fitting. Six fresh tofu (20 grams) is placed in a plastic container at room temperature. Experiments are made after the tofu has finished production and ready to sell (first day) until it decays (day six). Sensor response is obtained through a sniffing process (collecting 120 s, purging 180 s) with 60 samples per day. The results showed that the coefficient of determination (R2) was 0.834 and the Root Mean Square Error (RMSE) was 8.414 can be obtained. Based on this analysis, the prediction of the tofu shelf life with electronic nose using the curve fitting method was successfully carried out. © 2019 IEEE.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Cited by: 3
Uncontrolled Keywords: aroma, curve fitting, e-nose, shelf life, tofu
Subjects: Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Divisions: Faculty of Mathematics and Natural Sciences > Computer Science & Electronics Department
Depositing User: Sri JUNANDI
Date Deposited: 11 Feb 2026 07:27
Last Modified: 11 Feb 2026 07:27
URI: https://ir.lib.ugm.ac.id/id/eprint/25228

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